The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2002
Filed:
Sep. 29, 2000
Richard B. Mazess, Madison, WI (US);
David L. Ergun, Verona, WI (US);
Lunar Corporation, Madison, WI (US);
Abstract
An industrial inspection device uses measurements at two x-ray energy to measure the relative proportions of two materials of a binary industrial composition by determining a mass ratio of a preselected selected first and second material expected to be in the binary composition and such as would provide a photoelectric absorption and Compton scattering consistent with the attenuation of the x-rays at the first and second energy. A relative proportion at different locations can be used to develop an image of one basis material. The image can be used to determine whether a product has an unacceptable composition or inclusions of foreign bodies.