The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2002

Filed:

Nov. 05, 1993
Applicant:
Inventors:

James T. Pettingell, Escondido, CA (US);

James T. Snyder, Poway, CA (US);

Assignee:

EmCal, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/100 ;
U.S. Cl.
CPC ...
G02B 2/100 ;
Abstract

A variable dark-field illumination method and apparatus to produce microscopic and macroscopic images with a variable dark-field effect thereby making best use of various detector response characteristics. The variable dark-field of the invention is particularly characterized by an adjustable object contrast which optimizes the use of the various detectors dynamic range. The invention is particularly useful when coupled with a video camera and for macroscopic systems having a large depth object field. The dark-fields of the art have geometries which are objectionable because those geometries have very limited depths of field. The invention is particularly distinguished from the art as the dark-field methods and apparatuses of the art are generally geometrically restrictive and they do not provide variable contrast control for input images.


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