The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2002
Filed:
Jan. 24, 2001
Katsumi Ogino, Kamakura, JP;
Nikon Corporation, Tokyo, JP;
Abstract
A confocal microscope for observing the image of an object to be observed by scanning a spot light for illuminating the object through an objective lens, comprises an aperture stop for adjusting the numerical aperture of the objective lens; and a control unit for calculating a contrast of the image of the object corresponding to each focal position while varying the focal position of the objective lens along the direction of the optical axis so as to determine the height of the unevenness on the surface of the object from a change of the contrast, thereby setting the aperture stop to have the focal depth substantially equal to the height of the unevenness.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile