The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2002

Filed:

Nov. 12, 1999
Applicant:
Inventors:

Yufei Bao, Norcross, GA (US);

David Daugherty, Lawrenceville, GA (US);

Kevin Hsu, Roswell, GA (US);

Tom Q. Y. Li, Cupertino, CA (US);

Calvin M. Miller, Naples, FL (US);

Jeff W. Miller, Kennesaw, GA (US);

Assignee:

Micron Optics, Inc., Atlanta, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

Swept-wavelength lasers with accurately calibrated wavelength output which can be very rapidly scanned or swept over a selected wavelength band. The invention provides lasers that generate wavelengths in the 1550 nm range that can be swept over about 50 nm. These swept-wavelength lasers are generally useful as accurately calibrated high power light sources. Calibration is achieved by use of a calibrated reference system. Swept-wavelength lasers are particularly useful as components of sensor interrogator systems which determine wavelengths reflected (or transmitted) by Fiber Bragg Gratings (FBG) in sensor arrays. Swept wavelength lasers of this invention are also generally useful for testing of WDM systems, particularly for their applications to current communication systems. the invention provides lasers, interrogator systems and systems for testing WDM components employing the lasers as a calibrated light source. The invention also provides methods for calibrating a swept-wavelength laser using the wavelength reference system provided herein as well as methods for detecting wavelengths in an optical signal or output using the interrogator systems provided herein. The invention further provides methods for testing the performance of WDM components using the testing systems provided herein.


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