The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2002
Filed:
Jan. 10, 2000
Christian Wollmann, Liegau, DE;
Lutz Wenert, Weissig, DE;
Joachim Ihlefeld, Dresden, DE;
Ralf Grieser, Dresden, DE;
Baumer Optronic GmbH, Radeberg, DE;
Abstract
A sensor unit ( ), a device, and a process for inspection of a surface ( &Dgr;) of an object ( ) for the purpose of identifying surface characteristics, such as structural defects. The device contains an emitting module ( ) and a receiving module ( ). The emitting module emits at least one beam bundle ( ″). The receiving module has at least one light receiver ( ). A rotating polygonal mirror wheel ( ) is located in the focal point of a parabolic mirror ( ). A beam bundle ( ) of the laser ( ) is directed onto the mirror ( ) by means of a telecentric lens, which guides the emitter and receiver beam on the same optical axis, whereby the parabolic mirror ( ) guides the deflected beam bundle ( ″) under a constant angle relative to the axis of symmetry ( ) of the parabolic mirror ( ) along a scanning line ( ) over the object ( ). The diffusely reflected beam bundle, after being deflected out of the common beam path, impinges on the processing unit ( ).