The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2002
Filed:
Apr. 26, 1999
Marlene A. Marro, Savona, NY (US);
William E. Schmitt, Hornell, NY (US);
Mark A. Summa, Painted Post, NY (US);
Gregory E. Williams, Corning, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
An apparatus for measuring polarization dependent loss is disclosed featuring several fiber optic couplers combined in tandem and oriented such that the PDL noise of the measurement system is reduced to a negligible level. By matching the PDLs of the couplers and vectorally subtracting opposite phases of polarization, the PDL of the measurement system is virtually eliminated. Thus, the PDL noise floor is lowered to near zero and the PDL of the optical device-under-test (DUT) can be accurately measured. The system is relatively inexpensive to implement and offers needed versatility because it measures the PDL of optical devices that operate in a reflection mode or in a forward transmission mode. Thus, it provides one PDL measurement solution for both types of devices.