The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2002

Filed:

Aug. 30, 2000
Applicant:
Inventor:

Stephen M. Oglesby, Cedar Rapids, IA (US);

Assignee:

Rockwell Collins, Inc., Cedar Rapids, IA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/908 ;
U.S. Cl.
CPC ...
G01R 2/908 ;
Abstract

An apparatus and method is disclosed for measuring and tuning circularly polarized antennas to simultaneously optimize axial ratio, resonant frequency, and impedance match. The antenna under test is mounted within the test apparatus. Located in the zenith and far field of the antenna are two rigidly mounted, orthogonal, and planar probes. The amplitude and phase developed by the antenna is measured at each probe. The computer calculates the zenith axial ratio from the measured amplitude and phase difference between the probes. The method further includes the steps to determine sense-of-rotation of the circular polarized wave, impedance match, and resonant frequency. This apparatus and method is an elegant, simple, and cost effective design that is applicable to any isolated circular polarized radiating element.


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