The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2002
Filed:
May. 30, 2000
Alfred N. Johnson, Knoxville, TN (US);
Jeffrey W. Dickinson, Kingston, TN (US);
John L. McGehee, Knoxville, TN (US);
David H. Weigle, Philadelphia, TN (US);
Timothy B. Ramsey, Knoxville, TN (US);
GTSD Sub III, Wilmington, DE (US);
Abstract
An apparatus, methods, and systems for assaying materials are disclosed using a combination of detectors that scan for areas of material non-uniformity, and assay the type and amount of radioactivity present in the material. Scanning detectors are provided to scan for non-uniform levels of radiation emanating from the material. If any non-uniformity is detected by the scanning detectors, the material non-uniformity is removed and handled with radioactive material protocols. The remaining material may then be subject to assay. If the material shows no signs of non-uniform radiation emission, the assay detectors are used to assay the material. If the concentration of any one or more radionuclides exceeds a predetermined limit, the assayed material is handled with radioactive material protocols. If there are no indications of non-uniformity and all the radionuclides meet the limit, the material is safe for release or clearance from radiological controls (including disposal in a landfill, recycling or other unrestricted uses). A system is also disclosed using a plurality of assay stations.