The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2002

Filed:

Sep. 07, 2000
Applicant:
Inventor:

Vincent S. Polkus, Delafield, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/08 ;
U.S. Cl.
CPC ...
A61B 6/08 ;
Abstract

In an X-ray imaging system having a detector and a tube disposed to project an X-ray beam field into the plane of the detector, visual indicators associated with the detector and the X-ray beam field, respectively, are provided for use in aligning the detector and beam field. A computational device is also provided for producing a signal representing offset, caused by X-ray beam angulation, between the geometric center of the beam field and the point at which the central axis of the projected X-ray beam intersects the detector plane. A display device, responsive to the produced signal, enables a system user to compensate for the offset when aligning the detector and beam field.


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