The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2002

Filed:

Sep. 14, 1998
Applicant:
Inventor:

Sung Soo Chung, San Jose, CA (US);

Assignee:

Cisco Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract

A mechanism for enabling compliance with the IEEE boundary-scan standard 1149.1 includes, in a first preferred embodiment, a compliance enabler working with non-compliant embedded boundary-scan cells to enable a Device Under Test (DUT) to function as an IEEE-standard-compliant part, thus allowing full utilization of existing test tool generation and operation of the IEEE standard. The enabler is preferably provided separately from boundary scan-cells embedded in core logic designs. The enabler includes a Test Access Port (TAP) controller and related decoding circuits to generate necessary compliance signals based on various conventional TAP controller variables and instruction functions. The embedded boundary-scan cells preferably include an internal scan cell architecture. In a second embodiment, a second enabler works with a TAP emulator to allow testing of TAP-less DUTs.


Find Patent Forward Citations

Loading…