The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2002
Filed:
Mar. 26, 1999
Yuki Nakamura, Tokyo, JP;
Yoshihiko Kuwahara, Tokyo, JP;
Tadashi Matsumoto, Tokyo, JP;
Kazuhiko Fukawa, Tokyo, JP;
NEC Corporation, , JP;
Abstract
In a multiple propagation wave parameter measuring method, transmission waves are radiated into an outer space. The transmission waves are received as a multiple propagation wave. Arrival directions of the transmission waves are measured on the basis of reception signals. The transmission wave arriving from one direction of the measured arrival directions is defined as a desired wave, and the transmission waves arriving from remaining directions are defined as unnecessary waves. A weight with which a reception power ratio of the desired wave to the unnecessary waves becomes maximum is calculated. The reception signals are multiplied with the weight to extract the reception signal in which the unnecessary waves are suppressed. A change in delay time of the desired wave from a transmitting device to a receiving device is calculated on the basis of the reception signal in which the unnecessary waves are suppressed. A machine-readable recording medium storing a multiple propagation wave parameter measuring program is also disclosed.