The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2002
Filed:
Mar. 14, 2000
Shogo Kosuge, Tachikawa, JP;
Takahiro Shimizu, Higashimurayama, JP;
Hitachi Denshi Kabushiki Kaisha, Tokyo, JP;
Abstract
A method and a device used in an optical microscope apparatus and for automatic focusing, and using an image contrast detection method which is not affected by noise. In order to remove a noise component, a contour component of an image picked up by the microscope is detected as a contour signal obtained by a difference between an original image and a delayed signal of the original image. A difference in level in maximum and minimum values of this contour signal is adopted as an image contrast signal. Such image contrast signals are produced at various microscope focusing direction positions. A position where a maximum image contrast signal is obtained is made to be an in-focus position.