The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2002

Filed:

Jun. 24, 2000
Applicant:
Inventors:

Torsten Schulze, Bad Oeynhausen, DE;

Reinhard Klose, Rinteln, DE;

Assignee:

INOEX GmbH, Bad Oeynhausen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/910 ;
U.S. Cl.
CPC ...
G01N 2/910 ;
Abstract

The invention relates to a device for detecting faults in and/or measuring the wall thickness of continuously moving strips, sections or tubes of plastics, using ultrasonic signals. To this end a number of ultrasonic heads (A, B, C, D) with transmitters and receivers are disposed distributed over the width of the strip or section or the periphery of the tube. The signal, emitted by a transmitter of an ultrasonic measuring head ( ) and reflected without scatter, is received by the receiver of said ultrasonic measuring head ( ), while the scattered signals reflected on the tube, section or the like are received by the receivers of its adjacent ultrasonic measuring heads (A, B). The inclusion of the scattered and reflected signals in the measurement appreciably increases the measured area per measurement in comparison with using exclusively the signal directly reflected without scatter.


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