The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2002

Filed:

Apr. 27, 2000
Applicant:
Inventors:

Michel Le Van Quyen, Paris, FR;

Jacques Martinerie, Palaiseau, FR;

Francisco Varela, Paris, FR;

Michel Baulac, Saint Cloud, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/0476 ;
U.S. Cl.
CPC ...
A61B 5/0476 ;
Abstract

A method for the detection of changes in dynamic properties of brain electrical activity is used to characterize and differentiate between physiological and pathological conditions, and to anticipate epileptic seizures. The detection of changes in dynamic properties of brain electrical activity is accomplished by constructing reference dynamics (S ) of a normal state from an EEG, comparing the reference dynamics (S ) with dynamics of a test segment (S ), and computing the similarities over the entire EEG recordings by sliding the test segment (S ) periodically.


Find Patent Forward Citations

Le Van Quyen, Michel. (2002). Method for the medical monitoring in real time of a patient from the analysis of electroencephalograms to characterize and differentiate between physiological or pathological conditions, and a method for anticipating epileptic seizures (U.S. Patent No. 6442421). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6442421

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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