The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2002
Filed:
Oct. 03, 2000
David B. Morken, San Jose, CA (US);
Edward S. Alcid, Sunnyvale, CA (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A method for performing inspection of raised electrical contacts, such as BGA and flip-chip-type contacts, and associated underlying vias. An electrical or electronic device or component having a major surface is provided including an array of closely spaced apart BGA flip-chip-type raised contacts with respective underlying vias. An area-of-interest (AOI), including at least one BGA or flip-chip-type contact/via structure is selected. The row containing the AOI is isolated, by computed tomography imaging, via electrical testing, or by removal, for example, from the electrical or electronic device or component. The AOI is mounted on an X-ray transparent substrate; and X-ray transmission imaging of the AOI is performed to inspect the at least one BGA or flip-chip-type contact/via structure for the presence of misalignments, voids, and delaminations.