The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2002

Filed:

Aug. 11, 2000
Applicant:
Inventors:

Lee Grodzins, Lexington, MA (US);

William Adams, Powell, OH (US);

Peter Rothschild, Newton, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/304 ;
U.S. Cl.
CPC ...
G01N 2/304 ;
Abstract

A system and method for inspecting an enclosure. A beam of x-rays is used for scanning the enclosure and for identifying areas of suspect material. The beam is subsequently coherently scattered off suspect materials, during the course of a single pass of the enclosure past the beam, for uniquely discriminating innocuous from contraband substances. One or more energy dispersive detectors measure radiation coherently scattered by an identified volume of suspect material. Absorption effects of the energy distribution of the coherently scattered radiation are compensated by means of a fiducial reference disposed between the interrogated object and the detectors.


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