The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2002
Filed:
Nov. 20, 2001
Applicant:
Inventors:
Won Taek Han, Daejon, KR;
Yune Hyoun Kim, Kwangju, KR;
Assignee:
Kwangju Institute of Science and Technology, Kwangju, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract
The present invention relates to a measurement method of resonant nonlinearity in a nonlinear optical fiber using a long period fiber grating pair. In particular, it relates to a characteristic evaluation method that can simply, but accurately, measure the nonlinear optical characteristics of an optical fiber.
Han, Won. (2002). Measurement method of resonant nonlinearity in a nonlinear optical fiber using a long period fiber grating pair (U.S. Patent No. 6441893). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6441893
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