The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2002

Filed:

Nov. 13, 2000
Applicant:
Inventors:

James M. Clark, Verona, NJ (US);

John E. Petzinger, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/500 ;
U.S. Cl.
CPC ...
G01R 2/500 ;
Abstract

A phase meter measures the phase of a first signal with respect to a second signal, where the first and second signals have different frequencies and the frequency of the first signal is higher than the frequency of the second signal. The phase meter samples the first signal using the second signal to produce a plurality of samples, where each sample has a sample phase and value. The phase meter permutes the plurality of sample phases to place their phase positions in phase order, and determines, for each permuted sample phase if the sample phase is within a phase range corresponding to a predetermined phase bin. If the sample is within a phase range for a phase bin, a bin counter for that bin in incremented. The phase of the faster signal is determined based on the counts in each of the phase bins.


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