The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2002
Filed:
Feb. 01, 2001
Erwin A. Hijzen, Breda, NL;
Raymond J. E. Hueting, Helmond, NL;
Koninklijke Philips Electronics N.V., New York, NY (US);
Abstract
Inner trenches ( ) of a trenched Schottky rectifier ( ) bound a plurality of rectifier areas ( ) where the Schottky electrode ( ) forms a Schottky barrier with a drift region ( ). A perimeter trench ( ) extends around the outer perimeter of the plurality of rectifier areas ( ). These trenches ( ) accommodate respective inner field-electrodes ( ) and a perimeter field-electrode ( ) that are connected to the Schottky electrode ( ). The inner field-electrodes ( ) are capacitively coupled to the drift region ( ) via dielectric material ( ) that lines the inner trenches ( ). The perimeter field-electrode ( ) is capacitively coupled across dielectric material ( ) on the inside wall ( ) of the perimeter trench , without acting on any outside wall ( ). Furthermore, the inner and perimeter trenches ( ) are closely spaced and the intermediate areas ( ) of the drift region ( ) are lowly doped. The spacing is so close and the doping is so low that the depletion layer ( ) formed in the drift region ( ), from the Schottky barrier ( ) and from the field-relief regions ( ) in the blocking state of the rectifier, may deplete the whole of the intermediate areas ( ) between the trenches ( ) at a blocking voltage just below the breakdown voltage. This arrangement reduces the risk of premature breakdown that can occur at high field points in the depletion layer ( ), especially at the perimeter of the array of rectifier areas ( ).