The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2002
Filed:
Sep. 10, 1999
Applicant:
Inventors:
Vincent P. Stanton, Jr., Belmont, MA (US);
Jia Liu Wolfe, Winchester, MA (US);
Tomohiko Kawate, Cambridge, MA (US);
Gregory L. Verdine, Lexington, MA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12P 1/934 ; C12Q 1/68 ; C07H 2/102 ; C07H 2/104 ;
U.S. Cl.
CPC ...
C12P 1/934 ; C12Q 1/68 ; C07H 2/102 ; C07H 2/104 ;
Abstract
The present invention relates to methods for the analysis of polynucleotides including detection of variance in nucleotide sequence without the need for full sequence determination, full sequence determination of a polynucleotide, genotyping of DNA and labeling a polynucleotide fragment during the process of cleaving it into fragments.
Stanton, Jr., Vincent. (2002). Method for analyzing polynucleotides (U.S. Patent No. 6440705). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6440705
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile