The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2002

Filed:

Jan. 25, 2001
Applicant:
Inventors:

J. Elon Graves, Kailua, HI (US);

Malcolm J. Northcott, Kailua, HI (US);

Assignee:

Aoptics, Inc., Campbell, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 ;
U.S. Cl.
CPC ...
A61B 3/10 ;
Abstract

An apparatus for measuring optical aberrations of the human eye wherein the person positions his or her eye on an optical axis of the apparatus and looks at an illuminated target on the optical axis that is visible to the eye for allowing the eye to focus on the target and establish a position of the eye. A collimating lens on the optical axis is movable along the optical axis for adjusting the apparent optical distance between the eye and the target. A light source directs a predetermined light beam along the optical axis into the eye and onto the retina of the eye as a spot of light. A lens reimages the light scattered from the light spot on the eye retina into a wavefront curvature sensor that forms two oppositely defocused images on an image detector, and a computer processes and analyzes the two defocused images for measuring the optical aberrations of the eye.


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