The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2002
Filed:
Aug. 11, 1999
Roger Ned Bailey, Austin, TX (US);
Michael Stephen Floyd, Leander, TX (US);
Bradley McCredie, Austin, TX (US);
Kevin Franklin Reick, Austin, TX (US);
Hugh Rodney Stigdon, Georgetown, TX (US);
Jennifer Lane Vargus, Cedar Park, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
The foregoing objects are achieved as is now described. A method and system for testing an integrated circuit are provided. A test substrate is provided which is manufactured by the same particular production technology for which the complex integrated circuit is designed. A pattern generator for generating test data and a result checker for comparing output data are embedded on the test substrate. Isolated portions of circuitry of the integrated circuit are selectively embedded onto the test substrate. The isolated portions of circuitry are subjected to testing by applying test data from the pattern generator to the isolated portions of circuitry. Errors in the isolated portions of circuitry are detected with the result checker by comparing data output from the isolated portions of circuitry with predetermined expected data, such that the integrated circuit is tested by susets, independently of testing the integrated circuit in its entirety.