The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2002

Filed:

May. 07, 1999
Applicant:
Inventor:

Kevin Chiang, Fremont, CA (US);

Assignee:

Oak Technology, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 1/08 ; G06F 1/500 ;
U.S. Cl.
CPC ...
G01K 1/08 ; G06F 1/500 ;
Abstract

Method and system for estimating processing time delay &Dgr;t of a selected signal processing device and temperature T of the device. A selected input signal is received by a first sub-system that includes the selected device and by a second sub-system having a controllable time delay, producing first and second sub-system output signals. The first and second sub-system output signals are compared to estimate the time delay of the selected device. A known relationship T=f(&Dgr;t ) is used to estimate temperature of the selected device and to determine whether this temperature is higher than a permitted or threshold device operating temperature. First and second signals, having the same or different shape parameters, may be processed by the system, and a statistical average of estimated device time delay can be computed to estimate device temperature.


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