The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2002

Filed:

Sep. 10, 1999
Applicant:
Inventor:

Hidechika Hayashi, Yokohama, JP;

Assignee:

Tosoh Corporation, Shinnanyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/086 ;
U.S. Cl.
CPC ...
G01N 3/086 ;
Abstract

A chromatogram analyzer which analyzes a chromatogram obtained by applying a sample containing n analytes (wherein n is a natural number of at least 2) to chromatography to detect peaks attributable to the n analytes.


Find Patent Forward Citations

Hayashi, Hidechika. (2002). Chromatogram analyzer (U.S. Patent No. 6438499). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6438499

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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