The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2002
Filed:
Mar. 17, 2000
Cindra A. Widrig Opalsky, Ottawa, CA;
David Opalsky, Ottawa, CA;
Andy Maczuszenko, Etobicoke, CA;
Imants R. Lauks, Rockcliffe Park, CA;
I-Stat Corporation, East Windsor, NJ (US);
Abstract
A sample analyzing system includes at least one sensor located at least partially within a sample retaining area. In addition, the sensor has at least one edge defining a sample detection location. This sample detection location defines an area within which the sensor is capable of detecting a presence or an absence of the sample. The system analyzes sample data by first introducing the sample into the sample retaining area and then mixing a reagent with the sample to commence formation of a reagent product. After mixing and upon detecting the absence of the sample from the sample detection location by the at least one sensor, an edge of the sample is moved past an edge of the at least one sensor and into the sample detection location. Then, upon detecting the presence of the sample in the sample detection location by the at least one sensor, the edge of the sample is moved past the edge of the at least one sensor and out of the sample detection location. Additionally, between oscillations, data may be collected by one or more sensors. By repeating these steps, an accumulation of material on or about the at least one sensor may be prevented.