The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2002
Filed:
Aug. 01, 2000
Applicant:
Inventors:
Richard B. Mazess, Madison, WI (US);
David L. Ergun, Verona, WI (US);
Assignee:
Lunar Corporation, Madison, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/3087 ;
U.S. Cl.
CPC ...
G01N 2/3087 ;
Abstract
A dual energy scanning densitometry system for imaging and measuring bone density maintains acceptable flux by adjusting the x-ray current or scan speed according to preceding scan line data. The amount of acceptable flux is maintained within limits modified by information about the region of the body being scanned so that different precisions may be maintained for different body regions. Scan speed and current may be controlled so that scan speed is maximized within the current limits. Essentially continuous flux control can be achieved.