The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2002

Filed:

Mar. 16, 2001
Applicant:
Inventors:

Marc Vernackt, Overmere, BE;

Ronny A. De Loor, Ghent, BE;

Anne-Marie F. Empsten, Lint, BE;

Mark Ryvkin, South Windsor, CT (US);

Assignee:

ManiaBarco NV, Ghent, BE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 2/732 ; G03B 2/754 ; G03C 5/00 ; H04N 1/04 ; A61N 5/00 ;
U.S. Cl.
CPC ...
G03B 2/732 ; G03B 2/754 ; G03C 5/00 ; H04N 1/04 ; A61N 5/00 ;
Abstract

A method is described for exposing both sides of a light sensitive sheet such as a printed circuit board panel according to imaging data. The method uses a device that has an optical system for scanning the sensitive sheet by one or more beams. The optical system scans both sides with the scan lines on one side mutually positioned with respect to the scan lines on the other side. According to one implementation, the optical system includes two optical scanning units driven by a single source, with a switch alternating the beam from the source to one then the other optical scanning unit.


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