The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2002

Filed:

Jun. 21, 2001
Applicant:
Inventors:

Nobuo Kojima, Kusatsu, JP;

Huajun Wen, Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 3/12 ;
U.S. Cl.
CPC ...
H03K 3/12 ;
Abstract

A new D-type latch structure is disclosed which has an input data sampling circuit and a symmetrical cross coupled latching circuit. The clock is delayed a predetermined time through an inverter circuit. The clock and the delayed inverted clock are used to generate a clock window time during which time the data input state and the inverted data input state are asserted on the latch output and complementary. The latch outputs are cross-coupled to pull-up and pull-down circuitry in each output circuit stage. A common pull-down transistor may be used to further reduce devices and to improve path delays from clocks to the latch outputs. The clock window assertion of states of the data inputs to the changing latch output is enhanced by the cross-coupled feedback of the latch outputs to improve the differential transition timings of the latch outputs. The D-type latch has fewer transistors and better delay, and more precise transition skew over prior art designs.


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