The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2002

Filed:

Jul. 11, 2000
Applicant:
Inventors:

Thomas Alan Early, Clifton Park, NY (US);

Elizabeth Anne Williams, Scotia, NY (US);

Bernadette Mondragon Bennett, Niskayuna, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

A method and system are provided that can be used at any stage of a manufacturing process to determine physical properties such as crosslink density. The method and system require little or no sample manipulation. The method and system are independent of rubber particle size and matrix composition. In the method and system, physical properties of a material are determined by NMR measurement. A T (spin lattice relaxation time) is measured for a material, a T (spin-spin relaxation time) is measured for the material and a value T /T is calculated that is representative of a physical property of material.


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