The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2002
Filed:
Feb. 04, 1999
Applied Science Fiction, Inc., Austin, TX (US);
Abstract
The present invention provides a system for image-capturing devices, such as scanners, to accurately identify defects in objects. The objects can be the physical images to be captured or elements of the image-capturing devices such as the platen and mirrors. The image-capturing devices can then use this defect information to remove defects from captured images. The invention teaches an advantageous arrangement of illumination and sensor elements to record defect data at an angle roughly equal to the angle at which light is directed to an object, i.e. where the angle of reflection roughly equals the angle of incidence. Light reflected from surface defects has a wider diffusion and thus a lower amplitude than light reflected from the surface of the object itself. Accordingly, this characteristic can be utilized to identify defect information. Image-capturing devices can use this defect information in software applications with mathematical algorithms to enhance captured images by removing the information that corresponds to defects.