The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2002

Filed:

Feb. 14, 2000
Applicant:
Inventor:

Hong Wang, Bellevue, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 ;
U.S. Cl.
CPC ...
A61B 8/00 ;
Abstract

An ultrasound array imaging system ( ) and method for improving beamforming quality and ultimately for improving an ultrasound image are disclosed. The ultrasound array imaging system ( ) includes a transducer ( ), a first beamformer ( ), a second beamformer ( ) and a comparator ( ). The first beamformer ( ) receives a first electronic echo signal from the transducer ( ) and produces a first apodized beam signal in accordance with a first beamforming apodization function. The second beamformer ( ) receives the same electronic echo signal from the transducer ( ) and produces a second apodized beam signal in accordance with a second beamforming apodization function. The first and second apodized beam signals are compared in the comparator ( ) which then combines the first and second apodized beam signals to create a combined apodized beam signal for producing an image that has its lateral and contrast resolution simultaneously optimized.


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