The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2002
Filed:
Jun. 14, 1999
Applicant:
Inventor:
Bo L. Andersen, Burlington, CT (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02H 3/05 ;
U.S. Cl.
CPC ...
H02H 3/05 ;
Abstract
A method of detecting systemic fault conditions in an intelligent electronic device is presented. The intelligent electronic device includes a microcontroller and associated memories. An algorithm (program) stored in a memory of the intelligent electronic device detects systemic fault conditions, i.e., root causes, as indicated by repeated, similar fault events.
Andersen, Bo. (2002). Method of detecting systemic fault conditions in an intelligent electronic device (U.S. Patent No. 6434715). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6434715
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