The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2002

Filed:

Jan. 21, 2000
Applicant:
Inventors:

Nozomu Hachisuka, Tokyo, JP;

Kenji Inage, Tokyo, JP;

Toshiaki Maeda, Tokyo, JP;

Assignee:

TDK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/312 ; G01R 3/102 ; G11B 5/455 ; G11B 5/39 ;
U.S. Cl.
CPC ...
G01R 3/312 ; G01R 3/102 ; G11B 5/455 ; G11B 5/39 ;
Abstract

A method for testing a composite type magnetic head having a MR element and an inductive element includes a current application step of applying a current to the inductive element, with applying no external magnetic field to the magnetic head, and a measurement step of measuring output characteristics of the MR element after the current application step is finished.


Find Patent Forward Citations

Hachisuka, Nozomu. (2002). Method and apparatus for testing composite type magnetic head having a magnetoresistive element and an inductive element (U.S. Patent No. 6433540). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6433540

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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