The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2002
Filed:
May. 10, 2001
Gwo-Jen Hwang, Hsinchu Hsien, TW;
Wen H. Ko, Cleveland Heights, OH (US);
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
This invention discloses a multi-range fiber-optic reflective micrometer, which comprises a light source for emitting a beam to an object surface, a receiving fiber-optic array, a photo-detector array, and a processor. The processor output a measured value in accordance with a differential signal and a summation signal both derived from the two electric signals corresponding to two adjacent receiving optical fibers which output two sampled lights of stronger intensities as well as a scale voltage. Since the ratio of the differential and the summation signals is proportional to a section of a whole displacement of the object, the whole measuring range could be extended by increasing the number of the receiving optical fibers while its resolution is kept at a degree of deep-sub-micrometer. Moreover, since the measured value is based upon a ratio of the differential signal to the summation signal, its accuracy will not be influenced by the fluctuation in the intensity of the light source and in the reflecting surface.