The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2002

Filed:

Jun. 29, 2000
Applicant:
Inventors:

Kevin J. Shinners, Madison, WI (US);

Neil G. Barnett, Winnipeg, CA;

Walter M. Schlesser, Madison, WI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A01F 1/200 ;
U.S. Cl.
CPC ...
A01F 1/200 ;
Abstract

Yield monitor apparatus and methods for a forage processing machinery are provided. The yield monitor measures a forage yield by variously measuring a forage impingement force, a forage volume flow, a forage volume increment accumulation, or a forage processing machinery drive load. The yield monitor may generate a yield amount, with the yield amount capable of being stored and displayed to a forage processing machinery operator. Alternatively, the yield monitor may generate a groundspeed control signal that is used by the forage processing machinery to control a forage processing machinery groundspeed or other forage processing machinery parameters.


Find Patent Forward Citations

Shinners, Kevin. (2002). Yield monitor for forage crops (U.S. Patent No. 6431981). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6431981

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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