The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2002
Filed:
Feb. 08, 2000
Moon Sung Park, Taejon, KR;
Jae Gwan Song, Taejon, KR;
Dong Chin Woo, Taejon, KR;
Hye Kyu Kim, Taejon, KR;
Chee Hang Park, Taejon, KR;
Abstract
This invention is related to a system and a method for reading high precision printed barcodes and their specification verification. The presented invention has a technique of reading both logistic sorting barcode (one or two dimension) and multi-layered structure barcode such as four-state barcode for automatic postal matter sorting. The invention also investigates height of high densely reduced barcodes in more than 3 steps, and precisely measures and reads the values of black bars thickness and white spaces. Previous techniques used laser beam for reading barcodes, but could not read barcodes, which have print density of less than 1/100 mm˜1/1,000 mm unit, and, it was also impossible to read precise specification values in case that barcode specification was composed of length unit indexes. The presented invention overcomes the previous said problems by using a laser diode array.