The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2002
Filed:
Jan. 08, 1999
Applicant:
Inventors:
Fred I. Grace, York, PA (US);
Rupert L. Nevin, Edgewood, MD (US);
Lawrence E. Murr, El Paso, TX (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/24 ;
U.S. Cl.
CPC ...
G01N 3/24 ;
Abstract
A method and apparatus for creating dynamic shear within metallic and non-metallic test sample materials under controlled conditions related to high ballistic impact includes the use of test sample having an end face with non-symmetrically placed surfaces extending away from a leading edge of the end face.