The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2002

Filed:

Aug. 27, 2001
Applicant:
Inventors:

Joachim Breuer, Aachen, DE;

Reinhard Hartung, Mönchengladbach, DE;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D01H 5/32 ;
U.S. Cl.
CPC ...
D01H 5/32 ;
Abstract

A method of directly determining setting values for an application point of regulation in a draw unit for drafting sliver includes the following steps: obtaining a plurality of measured values of a quality-characterizing magnitude, such as a CV value, of the drafted sliver; utilizing the measured values for formulating a function having a minimum constituting an optimal application point of regulation for controlling the draw unit; determining the optimal application point of regulation in a pre-operational run of the draw unit; obtaining measured values of at least two quality-characterizing magnitudes based on the drafted sliver; combining values of the quality-characterizing magnitudes at the sliver, which correspond to one another with respect to the application point of regulation, to a quality-characterizing number QK, and forming a function based on several numbers QK. The function has a minimum corresponding to an optimal application point of regulation R .


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