The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2002
Filed:
Aug. 21, 1998
Michael Wisor, Austin, TX (US);
Travis Wheatley, Austin, TX (US);
James A. Treadway, Austin, TX (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A method and apparatus for concurrent testing of a plurality of microprocessors, each of which may have a different revision, by creating an abstract base class which specifies the names of a plurality of tests, creating a derived class for each revision and defining each of the tests appropriately for each of the derived classes, instantiating an object from one of the derived classes for each of the microprocessors and executing the tests by reference to the objects. A computer system is configured to be coupled to the microprocessors and, upon execution of a debug/test application on the computer system, the revision of each microprocessor is determined and an object is instantiated from the derived class corresponding to the revision. Each object is thereby dynamically bound to the tests defined for the derived class corresponding to the revision, and references to the tests via the objects automatically execute the test code specific to appropriate revision of the microprocessor.