The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2002
Filed:
Dec. 21, 1999
Jantje E. Wilting, Eindhoven, NL;
Jan Timmer, Eindhoven, NL;
Koninklijke Philips Electronics, N.V., Eindhoven, NL;
Abstract
The size of a detail of an object is derived from a data set of data values relating to the object. The data set assigns the data values to positions in a multidimensional space. A direction is selected in the multidimensional space. The spatial resolution of the data set is higher in the selected direction as compared to the spatial resolution in other directions. The size of the detail is derived from data values in the selected direction. The selected direction can extend along the line of intersection which intersects a scanning plane in which the data values are acquired and a transverse plane extending at right angles to the longitudinal axis of the detail. The data values can be acquired an X-ray computed tomography imaging system, a magnetic resonsance imaging system, or a 3D ultrasound imaging system.