The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2002

Filed:

Dec. 02, 1999
Applicant:
Inventor:

Johannes J. Van Vaals, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 ;
U.S. Cl.
CPC ...
A61B 5/05 ;
Abstract

A magnetic resonance imaging (MRI) system is provided with an interventional instrument with an indicator element which influences, for example locally disturbs, the magnetic resonance image. The position of the interventional instrument within the patient to be examined is derived from the local disturbances in the image as caused by the interventional instrument. The degree of influencing of the magnetic resonance image is adjustable notably by rotation of the interventional instrument with the indicator element relative to the direction of the steady magnetic field of the magnetic resonance imaging system. For example, the indicator element is a paramagnetic strip which may include several segments of different magnetic susceptibility.


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