The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2002

Filed:

Sep. 06, 2001
Applicant:
Inventor:

Shiro Oikawa, Shiga-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/300 ;
U.S. Cl.
CPC ...
G01N 2/300 ;
Abstract

In a CT apparatus, e.g. an X-ray CT apparatus, according to this invention, a plural scan executing unit executes a first and a second helical scans successively, with an X-ray tube and an X-ray detector each advancing along helical paths having a 180° phase difference (bisectional phase difference) therebetween. Consequently, CT image composing data is acquired from opposite directions for each point in an area of interest. That is, the CT image composing data obtained, as a whole, covers a scanning range corresponding to 360°. Then, an image reconstructing unit performs an image reconstructing process properly based on the CT image composing data collected through all the helical scans and covering the 360° scanning range. As a result, artifacts are restrained from appearing in CT images ultimately obtained.


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