The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2002

Filed:

Mar. 09, 2000
Applicant:
Inventor:

Gary E. Carver, Raritan Township, Hunterdon County, NJ (US);

Assignee:

Agere Systems Guardian Corp, Berkeley Heights, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/100 ; F21V 9/16 ; G01J 3/28 ;
U.S. Cl.
CPC ...
G02B 2/100 ; F21V 9/16 ; G01J 3/28 ;
Abstract

In accordance with the teachings of the present invention, it has been discovered that an optical analysis that is uniquely based on geometrical rather than diffraction considerations, for the purposes of controlling the size of the region from which the photoluminescence is collected, provides an optical system capable of performing photoluminescence microscopy and/or spectroscopy without the disadvantages of the prior art. It is based, in part, on the use of an optical fiber(s) as a field stop within the detection arm(s) of the optical system for coupling the photoluminescence into an optical spectrum analyzer (OSA) and/or photodetector, wherein the diameter and the numerical aperture of the optical fiber are judiciously chosen to limit the field of view, or the region from which the photoluminescence is collected.


Find Patent Forward Citations

Loading…