The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2002
Filed:
Oct. 16, 2000
Paul Flormann, Heiligenhaus, DE;
IMS Messsysteme GmbH, Heiligenhaus, DE;
Abstract
A process for the determination of the thickness transverse profile and the thickness longitudinal profile of a running material strip. The process includes (a) determining the strip thicknesses in at least two measuring areas, (b) determining the longitudinal position of the thickness longitudinal profile, (c) measuring the strip thickness in the longitudinal position and setting a correction value to be zero, (d) measuring an adjustment setting (&Dgr;P) of the measuring unit for the longitudinal position, (e) calculating the gradient (k) of the strip thicknesses transverse to the direction of travel of the strip, (f) recalculating the correction value (&Dgr;K) from the previous correction values and the product of (k) and (&Dgr;P), (g) calculating the mean strip thickness (D ), (h) calculating the corrected strip thickness in the longitudinal position as the sum of (D ) and (&Dgr;K), (i) repeating steps (d) to (h) within an adjustment movement cycle and (j) determining the thickness transverse profile from the strip thickness and the thickness longitudinal profile from the mean strip thickness.