The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2002

Filed:

Sep. 14, 1998
Applicant:
Inventor:

Katsuhiro Miura, Ichikawa, JP;

Assignee:

Namco Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 1/140 ;
U.S. Cl.
CPC ...
G06T 1/140 ;
Abstract

It is an object to provide an image generating apparatus and method which can perform a high-quality translucence process with reduction of the hardware scale and processing load. The translucence process is performed according to a first translucence information OP used for performing the translucence control with respect to the respective portions of an object and a second translucence information OP used for performing the translucence control with respect to the entire object. The translucence control according to OP is invalidated with respect to a portion of the object that is judged to be opaque according to OP , that is, to be OP =1. For example, the translucence control may normally be carried out according to the relational expression of OP =OP ×OP . On the other hand, when a switching flag SFL is 0, OP is fixed at 1 or the translucence process is omitted, with respect to the opaque portion. Thus, both portions to be subjected to the translucence control according to OP and OP and that to be opaque irrespectively of the value of OP , can coexist on the same object.


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