The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2002
Filed:
Nov. 02, 1998
William Tze-You Chen, Endicott, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A semiconductor package arrangement and, more particularly, a light weight and miniaturized electronic package or module, wherein the dimensions between an integrated circuit comprising a semiconductor chip and those of a chip carrier have been optimized in order to provide for minimum weight and size relationships. Furthermore, disclosed is a method of forming the semiconductor package arrangement so as to produce a small, lightweight and essentially miniaturized chip-sized chip carrier package module. The chip carrier, which may be an organic laminate, multi-layer ceramic substrate or flexible substrate, as required by specific applications, is basically designed to possess overall smaller peripheral dimensions than those of the integrated circuit or semiconductor chip which is adapted to be mounted thereon. In essence, the chip carrier or substrate is electrically connected to the semiconductor chip through the intermediary of either solder bumps or a conductive adhesive, or other suitable flip chip connection methods. The utilization of an electronic package arrangement which comprises the mounting of a chip on a chip carrier or substrate, wherein the latter is of smaller peripheral dimensions than the semiconductor chip, and thereby eliminates in particular the edge stresses generated by the differentials in thermal expansion between the chip and chip carrier substrate, and in effect, reducing the previously generally encountered high mechanical stresses and extensive heat-induced warpage leading to potential failure of the electrical interconnects or solder joints.