The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2002

Filed:

Apr. 19, 2000
Applicant:
Inventors:

Igor Friedland, Holon, IL;

Mark Shechterman, Nes Ziona, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 3/14 ; H01J 5/16 ; H01J 4/014 ;
U.S. Cl.
CPC ...
H01J 3/14 ; H01J 5/16 ; H01J 4/014 ;
Abstract

The invention provides a device for linear scanning, including at least one reflecting element whereby an incident beam of light undergoes at least two reflections; at least one optical system comprising an objective capable of forming an image of an object, the objective, depending on the respective direction of the light beam, defining a pre-objective scanning space and a post-objective scanning space; a mounting structure for the at least one reflecting element; drive means for causing the mounting structure to perform a movement; and a light-detecting element for detecting the incident beam of light, or an element for producing light, wherein, with light-detecting, scanning takes place in the post-objective space, and with light-producing, scanning takes place in the pre-objective space.


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