The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2002

Filed:

Jun. 02, 2000
Applicant:
Inventors:

Evan George Colgan, Chestnut Ridge, NY (US);

Hisanori Kinoshita, Kusatsu, JP;

Hiroaki Kitahara, Ohtsu, JP;

Kai R. Schleupen, Yorktown Heights, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/184 ;
U.S. Cl.
CPC ...
H01L 2/184 ;
Abstract

A method for opening resist in raised areas of a semiconductor device, in accordance with the present invention, includes forming a conductive layer over a channel insulator layer to form a raised portion which includes a height above a substantially planar surrounding area. The channel insulator layer is aligned to a gate electrode. A photoresist layer is formed over the raised portion and the surrounding area and the photoresist is patterned by employing a gray scale light mask to reduce exposure light on the photoresist on the conductive layer over the raised portion such that after developing the photoresist, the photoresist is removed over a top surface of the raised portion but remains in the surrounding area. The conductive layer is etched in accordance with the photoresist to form source and drain electrodes which are self aligned to the channel insulator layer.


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