The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2002

Filed:

May. 28, 1998
Applicant:
Inventors:

Cecil H. Nelson, Chanhassen, MN (US);

Rodney R. Hintz, Delano, MN (US);

Thomas P. Bartsch, Maple Grove, MN (US);

Assignee:

Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 3/00 ; G01B 5/00 ;
U.S. Cl.
CPC ...
G01B 3/00 ; G01B 5/00 ;
Abstract

A method and apparatus for high speed acquisition of the dimensional parameters of a work piece are effected by simultaneously acquiring probe positional information, converting the probe positional information to standard characteristic data, and calculating multiple dimensional geometries using the converted probe position information. Selected characteristic data may be stored for use with multiple dimensional geometry calculations, reducing the calculation time. A computer and associated software are used to convert the positional information to dimensional geometry information.


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