The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2002
Filed:
Oct. 10, 2000
Applicant:
Inventors:
Toshiaki Asaoka, Aichi, JP;
Yoshinori Matsuyama, Aichi, JP;
Assignee:
Nidek Co., Ltd., Aichi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/28 ;
U.S. Cl.
CPC ...
G01B 7/28 ;
Abstract
In a target lens shape measuring device for measuring a target lens shape used to process an eyeglass lens, movement of a feeler in a radius vector direction is detected by a first detection system, and movement of a holding base by a moving system is detected by a second detection system. Calibration data is obtained based on the detection result by the second detecting system during the movement of the holding base by the moving system, and the detection result by the first detecting system is calibrated based on the obtained calibration data.